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  1.  18
    Frequency modulated X-ray diffraction I. Determination of partial structure factors.N. J. Shevchik - 1977 - Philosophical Magazine 35 (3):805-809.
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    Frequency modulated X-ray diffraction II. Structures of multi-element disordered systems.N. J. Shevchik - 1977 - Philosophical Magazine 35 (5):1289-1298.
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    Photoemission densities of states of sputtered arsenic films.N. J. Shevchik - 1977 - Philosophical Magazine 35 (2):261-267.
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